Which microscopy technique is preferred for quantitative surface analysis?

Scanning Electron Microscopy (SEM) is preferred for quantitative surface analysis because it offers high-resolution imaging and the ability to analyze surface topography, composition, and morphology at the nanoscale. SEM operates by scanning a focused beam of electrons over a sample surface, which then emits secondary electrons that are captured to create detailed images. This technique provides not only qualitative information about the surface structure but also quantitative data such as surface roughness and particle size distribution.

In quantitative analysis, SEM can be equipped with energy-dispersive X-ray spectroscopy (EDS) for elemental analysis, allowing for precise measurements of the materials' composition. This capability extends its utility in various fields, including materials science, nanotechnology, and asbestos analysis, where understanding the surface characteristics is critical.

Other microscopy techniques, such as light microscopy, are limited by lower resolution and cannot effectively analyze surfaces at the nanoscale. Transmission Electron Microscopy (TEM) is primarily designed for internal structural analysis rather than surface details, and while Confocal Microscopy provides excellent depth resolution and optical sectioning, it does not match the surface analysis capabilities of SEM.