Which microscopy method can provide three-dimensional imaging?

Scanning Electron Microscopy (SEM) is the correct choice for providing three-dimensional imaging. This technique operates by scanning a focused beam of electrons across the surface of a specimen, which allows for the collection of topographical and surface detail. The resulting images can present a detailed three-dimensional view because SEM captures secondary electrons that are emitted from the sample surface, generating a high-resolution representation of its contours and textures.

While other microscopy methods offer valuable information, they primarily focus on different aspects of the sample. Transmission Electron Microscopy (TEM) is used for viewing the internal structure of ultra-thin specimens, thus providing two-dimensional images rather than three-dimensional ones. Light Microscopy is typically limited to observing specimens with visible light, and it also provides primarily two-dimensional images. Phase Contrast Microscopy enhances contrast in transparent specimens but does not inherently provide the three-dimensional depth that SEM does. Therefore, SEM stands out for its capacity to generate three-dimensional images, making it the most suitable choice in this context.